The new xSORT hand-held, energy-dispersive XRF (photo) offers precise laboratory-like analysis in engineering, PMI or scrap-sorting applications by non-laboratory-trained staff. A special silicon drift detector (SDD) with up to ten times the counting speed of conventional systems not only gives faster analysis and better detection limits for 41 elements from magnesium to thorium, but also allows measurement of light elements such as aluminum, silicon and phosphorous without complicated helium purging or vacuum techniques. Typically, the full range of elements can be measured in a single run of 2 s, or up to 10 s if light elements are included. — Spectro Analytical UK Ltd., Halesowen, U.K.