The D2 Phaser with XFlash detector is said to be the first desk-top instrument offering angle-dispersive and energy-dispersive x-ray diffraction as well as x-ray fluorescence measurements under ambient conditions. Based on Silicon Drift technology, the XFlash detector features energy resolution of less than 180 eV at count-rate levels of more than 100,000 cps. Measurements can be made on even loose powders. — Bruker AXS GmbH, Karlsruhe, Germany
Perform all types of x-ray analysis at your desk
| By Chemical Engineering