Since it was launched last September, Spectro xSORT’s original metal analysis capabilities have been expanded to include applications for RoHS (Restriction of Hazardous Substances) Directive compliance and lead screening as well as for the examination of soil in environmental testing and the direct analysis of ores, concentrates and tailings. The xSORT (photo) is an analytical instrument for rapid, non-destructive XRF (X-ray fluorescence) screening analysis. The device analyzes the content of all of the important elements between sulfur and uranium contained in the sample with measurement times of a few seconds. The silicon drift detectors used in xSORT process signals up to ten times faster than the detectors conventionally used in handheld XRF instruments, says the firm. — Spectro Analytical Instruments GmbH, Kleve, Germany
Elemental analysis in the palm of your hand
| By Chemical Engineering