Developed for laboratories conducting environmental, geological and waste-disposal analysis, the Xepos HE (heavy element) x-ray fluorescence (XRF) instrument is optimized for the analysis of medium and heavy elements. It achieves detection limits that are a factor of five to ten times better than conventional ED-XRF instruments, says the company. The system features a flexible excitation source — an “extremely stable” end-window tube with a power of only 50 W. The unit also offers a target changer with up to eight polarization and secondary targets that allows users to achieve the additional sensitivity and accuracy for analyzing medium and heavy elements. The system is equipped with a large-area SDD detector, which also provides much higher sensitivities for faster measurement or lower detection limits. — Spectro Analytical Instruments GmbH, Kleve, Germany